2006, Volume 9, Issue 17+18
Characterization of Oxide Layers on Nuclear Structural Materials by X-Ray Diffraction and Electrochemical Techniques
1 University of Pitesti – Research Centre for Advanced Materials
2 National Institute of Cryogenics & Isotopic Technologies, Rm. Valcea
3 Institute for Nuclear Research – INR Pitesti
*Corresponding author: Viorel Malinovschi, e-mail: email@example.comPublished: October 2006
To predict the behavior of structural metallic materials into the CANDU nuclear reactor, the oxide films on the surface were growth in a controlled manner using an autoclave simulating the environment specific into the nuclear reactor. In order to establish the structural modifications of the oxide films, the X-ray diffraction (XRD) and electrochemical analysis were used. Analyzes performed shown difference between the carbon steel samples and Incoloy 800 samples exposed under different conditions corresponding to secondary circuit in CANDU nuclear reactor. The oxide phases were identified and the thicknesses of the films were calculated. The agreement between results obtained by these methods was discussed according to the microstructure of the samples.
X-ray diffraction; oxide films; electrochemical techniques.
Tag search X-ray diffraction oxide films electrochemical techniques