Progress of Cryogenics and Isotopes Separation
, ISSN: 1582-2575
1999, Volume 2, Issue 3+4
1999, Volume 2, Issue 3+4
Experimental Study About JFET' Behaviour at Low Temperatures
National Institute of Cryogenics and Isotope Separation - ICSI, Rm. Valcea
*Corresponding author: Mihai Culcer, e-mail: culcer@ns-icsi.icsi.ro
Published: October 1999Abstract
A BFW10 JFET caracteristics were investigated in the temperature range of 20K to 300 K in order to determine his behaviour at low tempertures and the possibility of using it in cryogenic circuits.
Keywords
Cryogenic temperatures, FET caracteristics, carrier freeze out.
Tag search Cryogenic temperatures FET caracteristics carrier freeze out
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