Progress of Cryogenics and Isotopes Separation , ISSN: 1582-2575
1999, Volume 2, Issue 3+4

Experimental Study About JFET' Behaviour at Low Temperatures

Mihai Culcer * , Mariana Iliescu

National Institute of Cryogenics and Isotope Separation - ICSI, Rm. Valcea

*Corresponding author: Mihai Culcer, e-mail:

Published: October 1999


A BFW10 JFET caracteristics were investigated in the temperature range of 20K to 300 K in order to determine his behaviour at low tempertures and the possibility of using it in cryogenic circuits.


Cryogenic temperatures, FET caracteristics, carrier freeze out.

Tag search Cryogenic temperatures FET caracteristics carrier freeze out